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SEMI M23-1000 (technical revision)
ラベル貼付領域（オプション）
5 These test methods do not cover requirements either for the equipment used to measure the edge profile or for the methodology of such measurement
part 3-3 to part 6-3 and IEC 61784-1
The purpose of this Standard is to establish a standard specification of marking on semiconductor devices to identify individual device by unique identification code and possible optional information to suggest a part of manufacturing information
E18800 - SEMI E188 - Specification for Malware Free Equipment Integration Lang-English SEMI M23-1000 (technical revision)The nature of semiconductor manufacturing supply chains requires standards for mitigating potential threats. By preventing the introduction of external threats into the manufacturing ecosystem, device manufacturers and equipment suppliers will benefit from clear mutual expectations and improved equipment reliability and uptime. This Standard provides a framework for how to mitigate the propagation of malware to manufacturing facilities during capital