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commonly called metric
1-0623 (technical revision)
SEMI Data Path Task Forceの形成に至る数ヶ月間，International Sematechは，マスクEDAの課題に焦点を当てた一連の会議を主催した。タスクフォースの多くの参加者は，これらのSematechの会議にも関わり，これらのセッションからのはるかに有用な情報により，この仕様の定義を進展させた。
SEMI MF1529-0923 (technical revision)
1 and serves as an umbrella document for more specific specifications
D08600 - SEMI D86 - Test Method of Flicker Nuisance for Wide-Visual-Field Displays ElnTpc-Safety - Human commonly called metricThis Test Method aims to elucidate the measures of flicker nuisance from playing motion pictures on wide visual field displays, such as large size curved displays, near eye displays or flexible displays etc. The Test Method proposes an objective detection algorithm and presents resultant examples on assessing flickering light from display applications. Finally, the Test Method reveals that the 90th percentile of magnitude spectrum is a proper measure
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